K_4[Ru(CN)_6]对T-颗粒溴碘化银乳剂感光性能及光电子寿命影响的研究  被引量:2

The Study of Effect of K_4[Ru(CN)_6] Dopant on Photographic Properties and Photoelectronic Lifetime of Silver Iodobromide T-grain Emulsion

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作  者:王英茹[1] 柳青[1] 

机构地区:[1]中国乐凯胶片集团公司研究院,河北保定071054

出  处:《影像科学与光化学》2008年第3期244-253,共10页Imaging Science and Photochemistry

摘  要:本文研究了K4[Ru(CN)6]掺杂剂对T-颗粒溴碘化银乳剂感光性能以及光电子寿命的影响,研究结果表明,掺杂剂的掺杂量、掺杂位置以及在乳剂颗粒内部的分布区域对乳剂的感光性能都有影响.掺杂位置接近表面或接近颗粒几何核心时效果明显,掺杂位置接近富碘区域时,乳剂的感光度变化不明显或是下降.掺杂位置决定了掺杂剂的最佳用量,在66%—92%位置掺杂时,感光度提高最为显著.与未掺杂乳剂相比,最佳掺杂位置和最佳掺杂量乳剂的自由光电子与浅束缚光电子的寿命都有所延长.The effect of K4 [Ru(CN)6 ] dopant on the photographic properties and photoelectronic lifetime of the iodobromide T-grain emulsion was studied in this paper. The results showed that the doping amount, position and distribution of the dopant had effected on photographic properties of the emulsion significantly. The relative sensitivities of the emulsions were remarkable increased when the dopant near to the surface and the core of the grain and decreased when the doping region was near the iodide. The preferred doping amount depends on the doping position, and the optimal relative sensitivity was at the position of 66%-92%. The dopant K4[Ru(CN)6] can also prolong the decay time of the free electron.s and the shallow-trapped electrons, i.e. prolong their lifetime.

关 键 词:掺杂 浅电子陷阱 K4[Ru(CN)6] 溴碘化银 T-颗粒乳剂 光电子寿命 

分 类 号:TQ572[化学工程—精细化工]

 

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