粉末压片-X-射线荧光光谱法测定五氧化二钒中主次成分  

Determination of major and minor components in vanadic oxide by the powder press slice-X-ray fluorescence spectrometry

作　　者：陈荣庆 

机构地区：[1]攀钢技术质量部,四川攀枝花617000

出　　处：《冶金分析》2008年第4期8-12,共5页Metallurgical Analysis

摘　　要：介绍了粉末压片-X-射线荧光光谱法测定五氧化二钒中V2O5，Si，P，Fe，K2O，Na2O，S含量的分析方法。根据五氧化二钒样品中主次成分含量范围，用高纯试剂配制出具有成分含量梯度的并经其他方法定值的校准样品绘制校准曲线；以仪器提供的基体校正方法消除吸收与增强效应影响，用本文提出的“干扰增量法”测量与计算出重叠校正系数K，输入仪器自动校正，同时评估出干扰元素一定含量影响分析元素的净增含量。该方法与其他方法测定样品结果之间具有良好的一致性，同一试样的11次制片测定，各成分结果的相对标准偏差在0．073％-7．35％范围内。A method for determining V2O5, Si, P, Fe, K2O, Na2O and S in vanadic oxide by powder press slice-X-ray fluorescence spectrometry was introduced. Based on the content range of major and minor chemical components in vanadic oxide, calibration curve was drawn by the calibration samples prepared with high purity reagent. These samples had content gradient of components, which were defined by other methods. The matrix correction method provided by equipment was used to eliminate the influence of absorption and strengthening effects. Overlapping correction coefficient K was meas- ured and calculated by interference increment method developed in this study. By inputting the auto- matic correction of equipment, the effect of certain interference elements on the net increment for tested elements was evaluated at the same time. The determination result of this method had good agree- ment with that of other methods. The relative standard deviation of each component was in the range of 0.073%-7.35% in 11 times of determination for same samole.

关 键 词：粉末压片 X-射线荧光光谱 五氧化二钒 干扰增量法 主次成分 

分 类 号：O657.34[理学—分析化学]