一种实用的高精度ADC测试方法  

A practical method to test high-resolution ADC

作　　者：柯新花[1] 卢宋林[1] 许瑞年[1] 许升辉[1] 李瑞[1] 沈天健[1] 

机构地区：[1]中国科学院上海应用物理研究所

出　　处：《核技术》2008年第5期374-378,共5页Nuclear Techniques

摘　　要：模数转换器(Analog-to-Digital Converter,ADC)是模拟数字混合信号系统中的重要模块,是电子器件中的关键器件。随着ADC速度和精度的提高,如何高效、准确地测试其动态和静态参数是ADC测试研究的重点。本文阐述在缺少现成的标准输入信号源情况下进行高精度ADC线性度和分辨率的测试,实现低成本、高可靠性的高精度ADC计算机辅助测试的方法。该方法在几类AD转换卡(数据采集卡)上进行了验证。Analog-to-digital converter is an important components of signal processing systems. With improved speed and resolution of ADCs, how to test the dynamic and static performance becomes critical to ADC applications. In this paper, we present a low cost high reliability computer-aided method. It can be realized without standard input signal generator. The ENOB and INL of high-resolution ADCs were tested. This method has been verified on several kinds of A/D converter cards.

关 键 词：高精度ADC 数字信号处理器 有效位数 积分线性度 

分 类 号：TL503.5[核科学技术—核技术及应用] TM930[电气工程—电力电子与电力传动]