有孔探针近场拉曼光谱和成像技术进展  

Development of Aperture Probe Near-Field Raman Spectroscopy and Microscopy

作　　者：江洋[1] 任斌[1] 田中群[1] 

机构地区：[1]厦门大学固体表面物理化学国家重点实验室,厦门大学化学化工学院,福建厦门361005

出　　处：《光谱学与光谱分析》2008年第5期1080-1090,共11页Spectroscopy and Spectral Analysis

基　　金：国家自然科学基金项目(20433040,20673086);教育部博士点基金(20040384010)资助

摘　　要：基于有孔探针SNOM的近场拉曼光谱和成像技术的出现使得拉曼光谱的分辨率突破了光学衍射极限,从而提供了一个有力的工具对样品亚波长尺度之下的化学信息进行表征。文章讨论了探针性质对实现近场拉曼光谱的影响,并全面地介绍了有孔探针近场拉曼光谱发展十余年来在纳米尺度化学分辨成像、液-液界面性质研究、微观层面解释SERS增强机理、图像化反映SERS热点分布等诸多领域的研究进展。The appearance of near-field Raman spectroscopy that is based on aperture probe scanning near-field optical microscopy makes the resolution of Raman spectroscopy beyond the optical diffraction limitation. It provided a powerful tool to probe chemical information of sample on subwavelength scale. The present article illustrates the influence of probe character on nearfield Raman spectroscopy. Furthermore, the development over ten years in chemical resolution imaging on nanoscale, special properties of liquid-liquid interface, exploring SERS mechanism and observing hotspots beneath subwavelength scale etc. were introduced in detail

关 键 词：近场光学显微镜 近场拉曼光谱 近场拉曼成像 表面增强拉曼光谱 

分 类 号：O657.3[理学—分析化学]