加速器真空室常用材料二次电子产额的测量  

Measurement of SEY resulting from some materials building accelerator vacuum chamber

作　　者：朱存宝[1] 张耀峰[1] 尉伟[1] 王建平[1] 范乐[1] 张波[1] 王勇[1] 

机构地区：[1]中国科学技术大学国家同步辐射实验室,安徽合肥230029

出　　处：《真空》2008年第3期18-21,共4页Vacuum

基　　金：国家自然科学基金(10675119)支持项目

摘　　要：通过电子枪的优化设计、测量电路的设计以及测量方法的选择,成功设计了一种加速器真空室常用材料二次电子产额的测量装置。用此系统测量了原电子能量在0～3 keV时不锈钢、无氧铜、TiN膜等材料的二次电子产额,某些相同材料的测量结果与国内外资料相近似。实验结果可为新一代加速器真空室的设计以参考,对于国内在此领域的深入研究有一定的借鉴意义。A measuring system for secondary electron yield （SEY） resulting from some materials used to build up the accelerator vacuum chamber was set up successfully by an optimized design of both electron gun and measurement circuit and efficient selection of measurement method. The SEY resulting from stainless steal （SS）, OFHC and SS coated with TiN thin films were all measured by the system where the primary electron energy was 0-3keV. The measurement results showed the similerities in comparison with the reported data in earlier works, and can be taken as reference for the design of next generation of accelerator vacuum chamber to further the research in this field .

关 键 词：二次电子产额 测量装置 电子枪 优化设计 

分 类 号：O462.2[理学—电子物理学] TB741[理学—物理]