角分辨XPS对自组装单分子层厚度和官能团位置的定性及定量研究  

Angle-resolved XPS Studies of Self-assembled Monolayers on the Quantitative and Quanlitative Determination of Location of Function Groups and the Thickness of Monolayers

作　　者：张祺[1,2] 黄惠忠[1,2] 何会新[1,2] 于化忠 刘忠范[1,2] 

机构地区：[1]北京大学物理化学研究所 [2]北京大学化学系

出　　处：《Chinese Journal of Chemical Physics》1997年第3期201-204,共4页化学物理学报（英文）

摘　　要：用角分辨ＸＰＳ（Ａｎｇｌｅ－ｒｅｓｏｌｖｅｄＸＰＳ）研究了ＨＳ（ＣＨ２）１０ＣＯＯＨ（Ⅰ），ＨＳ（ＣＨ２）３ＯＣ６Ｈ４Ｎ＝ＮＣ６Ｈ４（ＣＨ２）７ＣＨ３（Ⅱ）和ＨＳ（ＣＨ２）６ＨＳ（Ⅲ）３种分子在Ａｕ膜表面制备的自组装单分子层。得出了（Ⅰ）中Ｓ原子、（Ⅱ）中Ｓ、Ｎ原子距膜表面的垂直距离。并结合构象分析确定了分子的取向和倾角。对分子（Ⅲ），则得出了分子在紫外光照射下氧化反应的选择性。发现氧化主要在底层和金相接的Ｓ原子上发生。Self-Assembled Monolayers (SAMs) formed by molecular (Ⅰ) HS (CH 2) 10 COOH,(Ⅱ)HS(CH 2) 3OC 6H 4N=NC 6H 4(CH 2) 7CH 3 and (Ⅲ) HS (CH 2) 6HS on gold film are investigated by Angle-Resolved XPS.The thickness from S and N atom to the surface of SAMs,molecular orientation and tilt angle are determined in molecular (Ⅰ)and(Ⅱ).We also find that when molecular(Ⅲ)is exposed to UV-light,the oxidetion of S atom is selective.The oxidetion reaction is mainly occured on the S atom in the bottom of the Monolayers.

关 键 词：角分辨XPS 自组装单分子层 XPS SAMS 

分 类 号：O647.11[理学—物理化学]