高能离子弹性散射测定高温超导薄膜的元素配比  

Determination of stoichiometry of high temperature superconducting thin films by elastic backscattering of high energy ions

作　　者：承焕生[1] 杨福家[1] 赵国庆[1] 张成腾 吴士明 要小未 

机构地区：[1]复旦大学

出　　处：《核技术》1990年第7期392-395,共4页Nuclear Techniques

摘　　要：本文介绍了用8.8MeV氦离子弹性散射测定Y-Ba-Cu-O超导薄膜元素配比的一种新方法。由于在8.8MeV时^(16)O(α,α)^(16)O非卢瑟福共振散射截面比卢瑟福弹性散射截面大25倍,因而一次测量即能得到Y-Ba-Cu-O全部元素的配比。本方法也适用于Bi-Sr-Ca-Cu-O和Tl-Ba-Ca-Cu-O等其它超导体系元素配比的测定。A technique for measuring stoichiometry of Y-Ba-Cu-O thin films with an accuracy of a few percent is described. This technique utilizes non-Rutherford backscattering of 8.8 MeV helium ions, which has an increased sensitivity for 16O by a factor of 25 over Rutherford backscattering. The method is not only well suitable to Y-Ba-Cu-O thin film but also to Bi-Sr-Ca-Cu-O and T1-Ba-Ca-Cu-O thin films.

关 键 词：超导薄膜 元素配化 离子 弹性散射 

分 类 号：TM261[一般工业技术—材料科学与工程]