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机构地区:[1]成都理工大学核技术与自动化工程学院,四川成都610059 [2]中国测试技术研究院,四川成都610021
出 处:《中国测试技术》2008年第3期138-140,144,共4页CHINA MEASUREMENT & TESTING TECHNOLOGY
摘 要:为解决传统的高精度A/D测量电路中需要在A/D前端搭建多级放大器而带来的成本及检测过程中的漂移问题,采用24位超低噪声模数转换器ADS1232,并在设计过程中使用了多种单片机抗干扰措施,设计出来的高精度测试仪器在硬件和软件上都得到了简化,该系统可以得到一个可靠的高精度的测量结果,解决了桥接传感器的前端问题。实践表明,该系统工作稳定,性能良好。In order to overcome the problems including high cost and drift, caused by the multi-stage amplifiers constructed in the front-end of the Analogy-to-Digital (A/D) in the traditional high precision A/D test circuit, a high-precision testing instrument used 24-bit analog-to-digital converter, a low-noise programmable gain amplifier (PGA), ADS1232 and many anti-interaction techniques of Microchip Controller Unit (MCU) were designed. It simplified both in hardware and software, and it could give reliable and high-precision measurement results. Also, it provided complete front-end for bridge sensor applications. All practical results show this system performance well and stably.
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