Optimization of (002)-Oriented ZnO Film Synthesis in Sol-Gel Process and Film Photoluminescence Property  

Optimization of (002)-Oriented ZnO Film Synthesis in Sol-Gel Process and Film Photoluminescence Property

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作  者:闫军锋 赵丽丽 张志勇 

机构地区:[1]School of Information Science and Technology, Northwest University, Xi'an 710069

出  处:《Chinese Physics Letters》2008年第6期2253-2256,共4页中国物理快报(英文版)

基  金:Supported by the Natural Science Foundation of Shaanxi Province under Grant No 2005F39, and the Applied Materials Innovation Fund of Xi'an under Grant No AM07012.

摘  要:By orthogonal design theory, technological parameters of the (002)-oriented ZnO film prepared in sol-gel process are optimized. A set of technological parameters for growing highly (002)-oriented ZnO film is obtained. As a result, it is proven that the Zn^2+ concentration is the most important factor to grow a highly (002)-oriented ZnO film. We take an appropriate Zn^2+ concentration 0.35mol/L for the aimed film, of which photoluminescence property is better than those of the films derived from other Zn^2+ concentrations precursor solution. The Zn^2+ concentration either larger or smaller than 0.35 mol/L leads to the (002)-oriented degree decrease of films. By employing an atom force microscope, a hexagonal atom arrangement, which indicates that the film site detected is a ZnO single crystal, is observed in the surface of the highly (002)-oriented film.By orthogonal design theory, technological parameters of the (002)-oriented ZnO film prepared in sol-gel process are optimized. A set of technological parameters for growing highly (002)-oriented ZnO film is obtained. As a result, it is proven that the Zn^2+ concentration is the most important factor to grow a highly (002)-oriented ZnO film. We take an appropriate Zn^2+ concentration 0.35mol/L for the aimed film, of which photoluminescence property is better than those of the films derived from other Zn^2+ concentrations precursor solution. The Zn^2+ concentration either larger or smaller than 0.35 mol/L leads to the (002)-oriented degree decrease of films. By employing an atom force microscope, a hexagonal atom arrangement, which indicates that the film site detected is a ZnO single crystal, is observed in the surface of the highly (002)-oriented film.

关 键 词:DESIGN 

分 类 号:O484.41[理学—固体物理]

 

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