基于光电检测技术的电缆材料缺陷检测系统  

The Photoelectric Inspecting Technique Inspecting System of Defects in Plastic Film

作　　者：徐国盛[1] 

机构地区：[1]潍坊学院信息与控制工程工程学院,山东潍坊261061

出　　处：《电子质量》2008年第6期37-39,共3页Electronics Quality

摘　　要：采用在测量上广泛使用的光电转换器件线阵CCD技术,完成了电缆材料缺陷检测系统的总体方案设计。基于DSO的电缆材料缺陷检测系统在平行光的照射下,通过线阵CCD控制电路获得电缆材料缺陷信号,使用虚拟示波器DSO-2902对一维缺陷信号进行采集、传输,借助于计算机进行分析处理,从而精准地检测出缺陷。The whole scheme design for inspecting system of defects in cable materials was achieved, in which the photoelectric conversion device linear array CCD technology was adopted. The inspecting system Of defects in cable materials based on DSO obtains signals of defects in cable materials with irradiation of parallel light by using linear array CCD control circuit. The 1-D defect signals were collected and transferred by using virtual oscillograph DSO-2902, and the 1-D defect signals were analyzed and processed by using computer. Thereby, the defects were precisely figure out.

关 键 词：光电检测 DSO 电缆材料 缺陷 

分 类 号：TN247[电子电信—物理电子学]