一套低本底反康普顿HPGeγ谱仪系统积分本底的实验研究  

Experimental Study of the Integral Background of a Low-background Anti-Compton HPGeγ-ray Spectrometer

作　　者：周春林[1] 徐振华[1] 韩峰[1] 徐从学[1] 

机构地区：[1]第二炮兵工程学院102教研室,陕西西安710025

出　　处：《核电子学与探测技术》2008年第2期418-421,共4页Nuclear Electronics & Detection Technology

摘　　要：本文对一套低本底反康普顿HPGeγ谱仪系统的积分本底进行了实验研究,测量了谱仪系统在无屏蔽、屏蔽室以及屏蔽室加反符合三种条件下的积分本底。结果表明,谱仪系统积分本底主要来源于康普顿连续坪区和40K核素1460keVγ射线全能峰。实验确定了40K主要来自NaI(T1)环探测器的六个光导玻璃窗及光电倍增管,两者所含40K总的放射性活度约为612Bq。This paper analyses the integral background of a low-background anti-Compton HPGeγ-ray spectrometer by measuring the integral background under three kinds of conditions： no shield, steel-lead complex shield, and steel-lead complex shield plus anti-coincidence. The results show that the integral background of the system is mainly caused by Compton plateau and the 1460keV γ-ray of ^40K. It is confirmed by experiment that ^40K is mainly from the six light guide glass windows and photomultipliers on the annular NaI（Tl） detectors. The activity of ^40K in the annular NaI（Tl） detectors is 612Bq in all.

关 键 词：低本底 反康普顿 HPGEΓ谱仪 积分本底 ^40K 

分 类 号：TL814[核科学技术—核技术及应用]