First Measurement of VUV Spectroscopy Using 1 m Normal Incidence Spectrometer on HL-2A  

作　　者：崔正英 孙平 董贾福 黄渊 王全明 傅炳忠 卢杰 陈伟 段旭如 丁玄同 杨青巍 森田繁 

机构地区：[1]Southwestern Institute of Physics, Chengdu 610041, China [2]National Institute for Fusion Science, Toki 509-5292, Gifu, Japan

出　　处：《Plasma Science and Technology》2008年第3期298-301,共4页等离子体科学和技术（英文版）

基　　金：National Natural Science Foundation of China(No.10475022)

摘　　要：A 1 m vacuum ultraviolet （VUV） spectrometer with temporal and spatial resolution was developed for impurity study of HL-2A tokamak. The instrument is equipped with two concave gratings blazed at 80 nm and 150 nm, respectively, and a windowless back-illuminated charge coupled device （CCD） detector of 256 × 1024 pixels. Tile total wavelength coverage of spectrometer is 30～ 320 nm with a spectral resolution of 0.015 nm at a width of entrance slit of 10 μm. A portion of this range is observed during a plasma discharge with a spectral range of 20 nm. The minimum integration time of the detector system is about 6.7 ms for each frame in a full binning mode. Using a space-resolved slit located between the entrance slit and the grating a radial profile on the vertical direction with a range of 400 mm can be obtained. The primary results were successfully obtained with high signal-to-noise ratio and good spectral resolution, which demonstrated the instrument functions very well.A 1 m vacuum ultraviolet （VUV） spectrometer with temporal and spatial resolution was developed for impurity study of HL-2A tokamak. The instrument is equipped with two concave gratings blazed at 80 nm and 150 nm, respectively, and a windowless back-illuminated charge coupled device （CCD） detector of 256 × 1024 pixels. Tile total wavelength coverage of spectrometer is 30～ 320 nm with a spectral resolution of 0.015 nm at a width of entrance slit of 10 μm. A portion of this range is observed during a plasma discharge with a spectral range of 20 nm. The minimum integration time of the detector system is about 6.7 ms for each frame in a full binning mode. Using a space-resolved slit located between the entrance slit and the grating a radial profile on the vertical direction with a range of 400 mm can be obtained. The primary results were successfully obtained with high signal-to-noise ratio and good spectral resolution, which demonstrated the instrument functions very well.

关 键 词：VUV spectroscopy line emission CCD 

分 类 号：O433[机械工程—光学工程]