光电耦合器辐照损伤的噪声检测  

Noise Diagnosis for Radiation Damage of Optocoupler

作　　者：李应辉[1] 陈春霞[2] 蒋城[2] 李冰[2] 

机构地区：[1]电子科技大学光电信息学院,四川成都610054 [2]重庆光电技术研究所,重庆400060

出　　处：《半导体光电》2008年第3期332-334,378,共4页Semiconductor Optoelectronics

摘　　要：分析了光电耦合器辐照噪声特性,提出了光电耦合器辐照噪声的检测方法,搭建了光电耦合器噪声测试电路。实验结果表明,噪声参量比电参量更能灵敏真实地反映光电耦合器的辐照损伤程度。Based on the analysis of the noise character of radiation optocoupler, a method for noise diagnosis is proposed. A testing circuit was set up. The results show that its noise parameter is more sensitive and factual to diagnose the radiation damage of optocoupler.

关 键 词：光电耦合器 辐照 噪声检测 

分 类 号：TN36[电子电信—物理电子学]