Characteristic Analysis of Diffraction from Restricted Output End Surface of Multiple Quantum Wells Planar Waveguide  

Characteristic Analysis of Diffraction from Restricted Output End Surface of Multiple Quantum Wells Planar Waveguide

在线阅读下载全文

作  者:HU Lin-shun GUO Fu-yuan LI Lian-huang GAO Rui PENG Yu-jia 

机构地区:[1]Fujian Provincial Key Laboratory of Photonic Technology,Institute of Laser &Optoelectronics Technology, Fujian Normal University, Fuzhou 350007, CHN

出  处:《Semiconductor Photonics and Technology》2008年第2期136-142,共7页半导体光子学与技术(英文版)

基  金:Program of the Science and technology Depart ment of Fujian Province(2007F5040);Natural Science Foundation of Fujian Province(A0540001)

摘  要:Based on Rayleigh-Sommerfeld scalar diffraction formula, analyzed is the diffraction field distribution of the restricted output end surface of multiple quantum wells planar waveguide by slit. Obtained is its analytical expression of field distribution, which permits accurate and effective study on the characteristic of diffraction field from the restricted output end surface of the waveguide by slit. Then, the variation curve of the beam propagation factor M2 versus the slit width is computed by the second moment method. It is useful for understanding the restricted diffraction properties of the multiple quantum wells planar waveguide. When the slit half width is bigger than the core layer's half width, the beam propagation factor M2 value tends to a constant 1.108. Therefore, the corresponding field amplitude distribution is approximated by Gaussian function, and the far field divergence half angle(θ0,G=0.091 8) is calculated by matching efficiency method.Based on Rayleigh-Sommerfeld scalar diffraction formula, analyzed is the diffraction field distribution of the restricted output end surface of multiple quantum wells planar waveguide by slit. Obtained is its analytical expression of field distribution, which permits accurate and effective study on the characteristic of diffraction field from the restricted output end surface of the waveguide by slit. Then, the variation curve of the beam propagation factor M2 versus the slit width is computed by the second moment method. It is useful for understanding the restricted diffraction properties of the multiple quantum wells planar waveguide. When the slit half width is bigger than the core layer's half width, the beam propagation factor M2 value tends to a constant 1. 108. Therefore, the corresponding field amplitude distribution is approximated by Gaussian function, and the far field divergence half angle(θ0,G=0. 091 8) is calculated by matching efficiency method.

关 键 词:multiple quantum wells planar waveguide factor M^2 matching efficiency Gaussian approximation 

分 类 号:TN201[电子电信—物理电子学]

 

参考文献:

正在载入数据...

 

二级参考文献:

正在载入数据...

 

耦合文献:

正在载入数据...

 

引证文献:

正在载入数据...

 

二级引证文献:

正在载入数据...

 

同被引文献:

正在载入数据...

 

相关期刊文献:

正在载入数据...

相关的主题
相关的作者对象
相关的机构对象