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作 者:刘新彩[1] 刘彦红[1] 张志华[1] 王红霞[1] 褚发朝 宫墨林 申新英
机构地区:[1]河北农业大学山区研究所,河北保定071001 [2]赞皇县林业局,河北赞皇051230
出 处:《河北农业大学学报》2007年第2期47-49,共3页Journal of Hebei Agricultural University
基 金:河北省自然科学基金项目(303228)
摘 要:探讨枝条电阻率作为核桃矮化性预选指标的可能性,为选择核桃矮化砧木提供理论依据。以核桃6年生不同品种嫁接树和3年生实生树为试材,研究了枝条电阻率与生长势的关系。结果表明:不同核桃品种嫁接树枝条电阻与生长势没有明显的相关性,但晚实核桃品种枝条电阻率大于早实品种。不同品种的核桃实生树枝条电阻分别与株高增长量、干周增长量、株高、干周呈显著正相关。枝条电阻可作为核桃实生树生长势的预选指标。The six-year walnut(Juglans regia L)cultivars and three years seedlings were used as material to study the relationship between the electronic resistance of shoots and growth vigor of walnut in the same year. The results indicated that the resistance of shoots of different walnut cultivars had insignificant correlation with the growth vigor, but the resistance of serotinous walnut was higher than that of precocious walnut. The resistance of shoots of different cultivars of walnut seedlings had positive correlation significantly with the increment of tree height, the increment of trunk girth, tree height and trunk girth. The resistance of shoots can forecast the growing of walnut seedlings.
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