SDRAM测试方法的研究和实现  

Research and implementation of SDRAM test method

作　　者：赵雪莲[1] 杨新涛[1] 

机构地区：[1]北京自动测试技术研究所

出　　处：《国外电子测量技术》2008年第5期12-15,共4页Foreign Electronic Measurement Technology

摘　　要：SDRAM与其它存储器相比,具有速度快、容量大、价格低、集成度高的优势;然而,SDRAM的测试却是一大难题。针对国内用户测试该类集成电路困难的现状,本文旨在研究SDRAM及相关测试理论,并以HY57V281620为例,实现了在国产ATE上SDRAM测试程序的开发。通过验证,该方法可以很好的解决长期以来SDRAM入库测试难的问题。SDRAM has the advantages of high speed, large capacity, low price and high integration; However, SDRAM testing is somewhat difficult based on domestic ATEs. In consideration of the present situation that the domestic users have some problems on the SDRAM testing, this paper discusses the SDRAM theory and researched related testing issues. Take the HY57V281620 as an example, it developes the test program on domestic ATE, with the verification of experiments, this method is proved to have solved the SDRAM testing issues very well.

关 键 词：算法图形产生器 测试向量 自动测试仪 SDRAM 

分 类 号：TP274.5[自动化与计算机技术—检测技术与自动化装置]