介质腔中自发辐射原子的寿命分布(英文)  

Lifetime distribution of the spontaneous emission of atoms in a dieletric microcavity

作　　者：贾正茂[1] 王树宝[1] 林圣路[1] 

机构地区：[1]山东师范大学物理与电子科学学院,济南250014

出　　处：《原子与分子物理学报》2008年第3期607-612,共6页Journal of Atomic and Molecular Physics

基　　金：国家自然科学基金(10774093,10374061)

摘　　要：在本文中,我们研究了半无限大介质板夹层对空腔中激发态原子的自发辐射率的影响,并利用寿命分布函数来描述原子衰变动力学的性质.在对称和非对称的结构中,分别计算了以原子在板中的相对位置为自变量的原子自发辐射率的函数.计算结果表明,原子的自发辐射率与介质腔的宽度以及外层半无限大介质板的折射率有关,介质腔可以增强或抑制激发态原子的激发.当介质腔的宽度足够大时,原子的寿命分布呈现指数衰减的形势.这些理论结果和实验值相符合的非常好.We study the spontaneous emission rate of excited atoms in a dielectric microcavity sandwiched by two dielectric semi-infinite spaces and introduce a lifetime distribution function to reveal decay kinetics in this paper. The spontaneous emission rate of atoms is calculated as a function of the position of atom in the microcavity in both symmetric and asymmetric structure cases. Our calculations show that the spontaneous emission rate of atoms depends on the thickness of the microcavity and the refractive indices of substrate. Both accelerated and inhibited decay processes appear. The lifetime distribution with a single-exponential decay can be observed in the much thicker microcavity, The calculated results are in good agreement with experimental results.

关 键 词：自发辐射率 衰减寿命 

分 类 号：O43[机械工程—光学工程]