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作 者:汤启明[1] 赵贵植[1] 龙卫忠[1] 李大康[1]
机构地区:[1]中国原子能科学研究院同位素研究所
出 处:《核化学与放射化学》1997年第4期56-59,共4页Journal of Nuclear and Radiochemistry
摘 要:研究了不同时间间隔淋洗68Ge-68Ga发生器时,68Ga的淋洗曲线、淋洗效率、68Ge的穿透率、流出液中的Sn含量及温度对68Ga淋洗效率的影响。实验结果表明,用1mol/LHCl淋洗以SnO2为吸附剂的68Ge-68Ga发生器,每次淋洗间隔时间1-14天不等,历经半年时间的淋洗,68Ge的穿透率保持在10-7数量级,淋洗液中的Sn含量保持在4×10-7以下。68Ga淋洗曲线的形状未发生变化,68Ga的淋洗效率为55%—75%,淋洗时间间隔变化不影响淋洗效率,温度对淋洗效率有较大影响。The stability of the isotope generator of 68 Ge 68 Ga,including the elution curve of 68 Ga,elution efficiency of 68 Ga,breakthrough of 68 Ge and the concentration of Sn in the elute are studied.The generator is eluted by 1 mol/L HCl at varying intervals from one day to fourteen days.The adsorbent of the generator is SnO 2.Based on the elutions in a half year,these data are obtained:breakthrough of 68 Ge is in the order of 10 -7 ,the concentration of Sn in the elute is less than 4×10 -7 ,the shape of the elution curve of 68 Ga is unchanged,but the elution efficiency of 68 Ga is varied from 55% to 75%. It is found that the varying elution interval does not change the elution efficiency of 68 Ga and varying elution efficiency is caused by varying temperature.
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