基于维纳滤波的红外焦平面非均匀性校正算法  

Nonuniformity Correction Algorithm for Infrared Focal Plane Arrays Based on Wiener Filtering

作　　者：刘永进[1] 朱红[1] 赵亦工[1] 

机构地区：[1]西安电子科技大学电子工程学院,西安710071

出　　处：《光电工程》2008年第7期136-139,共4页Opto-Electronic Engineering

基　　金：国家自然科学基金资助项目(60572151)

摘　　要：针对焦平面阵列上各探测单元光电响应的非均匀性,本文使用了维纳滤波技术来实现红外焦平面阵列非均匀校正。该方法首先根据实际情况确定一个输出延迟,然后采用维纳滤波并借助前后帧信息对当前帧进行多次估计,最后取其均值作为此帧的最终校正结果。文中使用了真实红外图像对算法性能进行验证,由于能够充分利用过去和将来的场景信息,因而本算法可以有效地去除原图像上的固定图案噪声。The performance of an infrared imaging system is affected by spatial fixed-pattem noise badly due to the different photoresponse of each detector in a focal plane array for the same irradiance. A novel nonuniformity correction algorithm based on Wiener filtering is developed, which first determines an output delay for being able to use the later information of an uncorrected image, and then by depending on the front and back information of a current frame, Wiener filter is adopted to estimate the current frame for several times. At last, take the average value of the estimations as the final correction result. The performance of the proposed algorithm is demonstrated with a real infrared image, and its advantage is that it can employ sufficient information to eliminate the fixed-pattern noise.

关 键 词：红外焦平面阵列 非均匀校正 固定图案噪声 维纳滤波 

分 类 号：TN215[电子电信—物理电子学]