退火温度对CsI(T1)薄膜微观结构和闪烁性能的影响  

Effect of Annealing Temperature on the Microstructure and Scintillation Properties of CsI(T1) Films

作　　者：程峰[1] 钟玉荣[2] 王宝义[2] 王天民[3] 魏龙[2] 

机构地区：[1]兰州大学物理科学与技术学院,兰州730000 [2]中国科学院高能物理研究所,北京100049 [3]北京航空航天大学理学院,北京100083

出　　处：《无机材料学报》2008年第4期749-752,共4页Journal of Inorganic Materials

基　　金：国家自然科学基金(10475096)

摘　　要：采用真空热蒸发法制备了CsI(T1)薄膜,然后进行了不同温度的真空热处理.用X射线衍射仪、扫描电子显微镜、X射线荧光光谱仪及正电子寿命谱仪对CsI(T1)薄膜样品进行了分析,并测得了样品的光产额.结果表明,该CsI(T1)薄膜沿(200)晶面择优取向生长.经过较低温度退火,CsI薄膜中的T1^+离子向薄膜表面扩散,薄膜中缺陷数量增加,且尺寸较大,光产额略微增高.经过250℃退火,薄膜中低温退火所形成缺陷得到恢复,薄膜缺陷尺寸变小,且数目减少,具有较好的结晶状态,光产额提高.经过400℃退火,薄膜结构发生显著变化,薄膜中缺陷大幅增加,结晶状态变差,Ti^+含量减少,光产额急剧下降.CsI（T1） films were prepared by thermal evaporation and annealed at various temperatures. Structure and scintillation properties of the films were examined using X-ray diffraction, scanning electron microscope, X-ray fluorescence spectrometry, positron annihilation lifetime spectroscope and scintillation pulse height spectrometry. Results show that the CsI films are in micro-columnar structure with a preferential （200） orientation. When the sample is annealed at 150℃, Tl^＋ ions diffuse to the sample surface. Consequently, the amount and size of the vacancy type of defects increase. However,the light yield increases a little atter anneaiea. The samples annealed at 250℃ have a good crystalline state and scintillation properties. As the annealing temperature increases to 400℃, the light output of the samples decreases seriously due to the dramatic change of their microstructure and the decrease of Ti^＋.

关 键 词：CsI薄膜 微观结构 闪烁性能 

分 类 号：O484[理学—固体物理] TL812[理学—物理]