基于LabVIEW的多路LED老化实时测量系统  

Real-time multiplex-channels measuring system for LED aging based on LabVIEW

作　　者：苏佳槟[1] 吴杜雄[1] 曾亚光[1] 李炳乾[1] 

机构地区：[1]佛山科学技术学院光电子与物理学系,广东佛山528000

出　　处：《仪器仪表用户》2008年第4期38-39,共2页Instrumentation

摘　　要：介绍一种基于LabVIEW平台的多路LED老化实时测量系统。该系统由LabVIEW、阿尔泰PCI2300数据采集卡构成,能够长时间不间断地测量、记录LED光强的变化,不仅能够将光强随时间的微小变化记录下来,而且避免了传统老化方法频繁关断对测量结果的影响。系统软件允许根据具体情况输入相应的校正公式,将光电探测器的输出电压转换为所测量的光学参数,并对其进行线性校准。A Multiplex-channel real-time Light emitting diodes （LED） aging system based on LabVIEW is reported. The system is built up with LabVIEW, data acquisition card （DAQ） PCI-2003 （art）. The fine light intensity changing through time of LED could be measured and recorded by the system, and then the shortcoming of tradition aging methods, continually on-off influence on aging characteristics, is overcome. Moreover, The revise formula can be input at the friendly user interface, the output voltage data given by opto-electronic detectors can be easily transform to optical parameters, and the nonlinear output characteristics of the detectors can be revised at the same time.

关 键 词：LABVIEW 发光二极管 老化 

分 类 号：TN911.7[电子电信—通信与信息系统]