半导体激光器线宽展宽因数的测量  

Measurement of the linewidth enhancement factor of semiconductor lasers

作　　者：宋兆欣[1] 禹延光[1] 叶会英[1] 张旭[1] 

机构地区：[1]郑州大学信息工程学院,河南郑州450052

出　　处：《光通信研究》2008年第2期60-63,共4页Study on Optical Communications

基　　金：国家自然科学基金资助项目(60574098)

摘　　要：光反馈自混合干涉技术是一种新出现的有别于传统双光束干涉的测试技术。文章基于此技术对半导体激光器进行线宽展宽因数的测量,以激光器HL7851G为对象进行了大量的实验,实验结果与线宽测量法基本一致,相对误差只有3.22%。相比线宽测量法,光反馈自混合法具有成本低、精度高的优点,是一种更加简洁有效的测量方法。Optical Feedback Self-Mixing Interferometry（OFSMI） is a newly emerging sensing and measurement technology. In this paper, for the measurement of the linewidth enhancement factor, large amounts of tests on semiconductor laser HL7851G are conducted hy using this technology. The test result is basically in conformity with that by using the conventional linewidth measurement methods with a relative error of only 3.22 %. Compared with the latter, OFSMI is a still more simple and effective measurement technique with the advantages of low cost and high precision.

关 键 词：光反馈自混合干涉 线宽展宽因数 半导体激光器 

分 类 号：TN247[电子电信—物理电子学]