材料光谱发射率精密测量装置  

Precision measurement facility of material spectral emissivity

作　　者：原遵东[1] 张俊祺[2] 赵军[2] 梁宇[1] 段宇宁[1] 

机构地区：[1]中国计量科学研究院,北京100013 [2]天津大学,天津300072

出　　处：《仪器仪表学报》2008年第8期1659-1664,共6页Chinese Journal of Scientific Instrument

摘　　要：采用光栅单色仪方案研究了光谱发射率的测量装置，以加热方式将材料样品温度控制在473～1000K，可在2—15μm测量样品的定向光谱发射率。应用锁相放大技术和统计测量方法提高样品与黑体的辐射亮度比较测量的信噪比。对测量装置性能进行了评价实验，并提出一种双黑体法评价光谱辐射测量系统的线性度。测量了氧化不锈钢样品和高发射率涂料的光谱发射率并进行了不确定度评定，合成标准不确定度小于0．04。A measurement facility of material spectral emissivity was studied using grating monochrometer. The directional spectral emissivity of a heated sample was measured at temperatures from 473 K to 1 000 K and spectral range between 2 μm and 15 μm. The signal-to-noise ratio of comparison measurement between the spectral radiances of the sample and blackbody was improved by a lock-in amplifier and statistical measurement method. The double- blackbody method was proposed and adopted to examine the linearity of the spectral detection system. Spectral emissivities of an oxidized stainless steel sample and a high-emissivity coating sample were measured and the measurement uncertainties were evaluated. The combined standard uncertainties are smaller than 0.04.

关 键 词：光谱发射率 测量 线性度 双黑体法 不确定度 

分 类 号：TN215[电子电信—物理电子学]