CCD摄象器件光响应均匀性测量  

PHOTORESPONSE UNIFORMITY MEASUREMENT OF CCD IMAGE SENSORS

作　　者：董亮初[1] 唐红兰[1] 陈敏辉[1] 

机构地区：[1]中国科学院上海技术物理研究所,上海200083

出　　处：《红外研究》1990年第4期301-308,共8页

摘　　要：提出用均方根偏差度来表征CCD摄象器件光敏元响应的不均匀度,理论分析了不均匀度测量对转移效率测量的依赖关系,得出一种精确测定不均匀度及转移效率的新方法,建立了测量系统。实验结果与理论分析相符。The photoresponse non-uniformity of CCD image sensors can be characterized by rms variance. The dependence of photoresponse non-uniformity on transfer efficiency is analyzed theoretically, leading to a new approach to determine photoresponse nonuniformity and transfer efficiency accurately. A measurement system is set up and the measurement results coincide with the theoretical analysis.

关 键 词：摄象器件 光响应 均匀性 测量 

分 类 号：TN36[电子电信—物理电子学]