测量热敏电阻温度特性曲线硬件电路的设计  

Hardware Circuit Design for Testing the Property Curve of Thermistor

作　　者：向英[1] 

机构地区：[1]广东技术师范学院,广东广州510665

出　　处：《现代电子技术》2008年第16期8-10,共3页Modern Electronics Technique

摘　　要：开发了测量热敏电阻温度特性曲线的硬件电路。使用DS18B20作为温度传感器,编写单片机与PC机间的通信程序,该温度值经串口发送到计算机中。电压信号利用声卡采集到计算机中,由LabVIEW软件编写的虚拟锁相放大器测量,实现了测量负温度系数的热敏电阻阻值随温度的变化曲线。利用电桥来提取阻值变化引起的电压变化信号,并且将测量值采集到计算机中,可以实现基于计算机的数据采集和分析。In this paper,a hardware circuit is designed to test the property curve of thermistor. Taking DS18B20 as temperature sensors,its communication program is written between single chip computer and PC and the temperature value is sent to PC by the serial port. By sound card,the voltage value is picked PC and tested via virtual lock-in-amplifier by LabVIEW. By the way,it may realize the change curve of negative temperature coefficient for the thermal resistor, its innovation lies in that it collects voltage variation values caused by resistance value changes by bridge and reads them into PC, thus realizing the computer-based data colletion and analysis.

关 键 词：热敏电阻 温度传感器 负温度系数 串口 锁相放大器 

分 类 号：TN710[电子电信—电路与系统]