二维表面粗糙度最小二乘评定基准线的改进  

Modified Least Square Reference Line for Surface Roughness Evaluation

作　　者：王中宇[1] 付继华[1] 孟浩[1] 

机构地区：[1]北京航空航天大学仪器科学与光电工程学院精密光机电一体化技术教育部重点实验室,北京100083

出　　处：《计量学报》2008年第3期203-206,共4页Acta Metrologica Sinica

基　　金：国家自然科学基金(50675011)

摘　　要：现行国家标准中二维表面粗糙度评定的最小二乘基准线为折线,并且存在间断现象。对现行最小二基准线进行了改进,用最小二乘直线在整个评定长度内进行滑动和平均,将获得的光滑曲线作为表面粗糙度的评定基准线。通过算例和仿真分析,改进的最小二乘方法能够描述缓变、连续曲线。该基准线与国际标准推荐的高斯基准线具有较好的一致性,并且粗糙度的评定结果相同。改进的最小二乘基准线对现行标准的最小二乘基准改动小,继承了现行最小二乘基准计算简便和实用的特点,评定过程中不损失轮廓数据,评定基准线光滑、连续,消除了现行最小二乘基准线间断的现象。The least square reference line for surface roughness evaluation in GB/T 3505--2000 is a broken line with discontinuity points between two evaluation lengths. The least square reference line is modified. A smooth reference line for surface roughness evaluation is obtained by sliding and averaging the least square mean lines in the evaluation length. Through the sample and simulation analysis, the modified least square method can represent the slow-motion and continuous curves. The modified least square reference line is well consistent with ISO Gauss reference line and their evaluation results for surface roughness are the same. The advantages of the modified least square reference line, simple to calculate and practicable, is inherited from the least square reference line in use with small changes. Moreover, the evaluation reference is smooth and continuous without losing primary data in processing, and the discontinuity of the least square reference line in use is eliminated.

关 键 词：计量学 表面粗糙度 最小二乘法 评定基准 

分 类 号：TB921[一般工业技术—计量学]