X射线能量谱间接测量方法  

Indirect measurement of X-ray spectrum

作　　者：邹晶[1] 王建光[1] 王文彬[1] 张朋[1] 

机构地区：[1]首都师范大学检测成像实验室,北京100037

出　　处：《光学技术》2008年第4期503-508,共6页Optical Technique

基　　金：国家自然科学基金(60472071);北京市自然科学基金(4051002)

摘　　要：X光机的X射线能量谱在CT图像硬化校正、散射校正和定量CT成像等技术中扮演着重要角色。提出了一种通过由质量衰减系数已知的材料构成的楔型模体的扫描数据来恢复X射线能量谱的方法。经GEANT4模拟数据及实采数据验证,该方法能够较好地恢复X光机的X射线能量谱。通过仿真实验,分析了在几个常用电压下模体材质和厚度对恢复X射线能量谱的影响。An indirect measurement method to estimate the spectrum of X-ray source via the transmission data of a known wedge model is proposed.The numerical results show that the proposed method is valid to estimate X-ray spectrum from both kinds of data simulated by GEANT4 and scanned on real CT device.Based on GEANT4 simulation at different voltages,some choices on the parameters of the wedge phantom are suggested,including materials,width and length of the wedge phantom. X-ray spectrum at different voltages can be properly estimated.

关 键 词：X射线能量谱 间接测量方法 楔型模体 扫描数据 

分 类 号：O434.1[机械工程—光学工程] O434.12[理学—光学]