RFID标签天线测试架设计  

The Design of a Testboard for RFID Tag Antenna

作　　者：孙静[1] 房志江[1] 耿军平[1] 金荣洪[1] 

机构地区：[1]上海交通大学电子工程系,上海200240

出　　处：《微波学报》2008年第4期49-52,55,共5页Journal of Microwaves

基　　金：国家自然科学基金委创新研究群体基金项目(60521002);国家自然科学基金(60501016)

摘　　要：针对RFID标签天线性能参数测试困难的问题,提出了平面结构的天线测试架的构想,设计并制作了一个实际的测试架。测试架包括平衡/不平衡转换器和阻抗匹配网络两部分,仿真和实验结果吻合得很好,能够实现对弯折线偶极子标签天线的输入阻抗、方向图和增益等参数准确的测量,并为其他小型平衡馈电天线的测试提供了参考。In this paper, a design concept of the planar testboard is proposed to solve the problem of RFID tag antenna testing. A practical testboard is designed and manufactured. The testboard composes of a Balun and an impedance matching network. The good agreement between the simulation and the measurement results shows that the testboard can be used to test the input impedance, radiation patterns and gains of the meander-line dipole tag antenna accurately, which also provides a testing scheme of other small-size antennas with balanced feed.

关 键 词：RFID标签天线 巴伦 阻抗匹配网络 

分 类 号：TN820[电子电信—信息与通信工程]