利用光电离技术研究奇宇称的Sm原子光谱  

Photoionization of odd-parity states of Sm atom

作　　者：关锋[1] 戴长建[1] 赵洪英[1] 

机构地区：[1]显示材料与光电器件教育部重点实验室

出　　处：《原子与分子物理学报》2008年第4期853-860,共8页Journal of Atomic and Molecular Physics

基　　金：国家自然科学基金(10574098,10674102);天津市自然科学基金(05YFJMJC05200)

摘　　要：采用一台频率可扫描的染料激光器将Sm原子从4f66s2 7FJ(J=1,2)态分别激发到具有不同电子组态的若干原子态上,然后利用光电离技术对处于上述状态的Sm原子进行高灵敏探测.通过波长固定在355 nm的紫外激光器,我们对一系列具有4f66s6p或者4f55d6s2电子组态的原子状态进行了精密的光谱测量.本实验研究不但确定了这些态的能级位置,还给出了它们的相对光谱强度.通过理论方法对光谱数据详细的分析,我们不但确认了文献中Sm原子的部分奇宇称能级的位置和光谱标识,还同时给出了许多新的跃迁及其光谱特性.In the experiment, the wavelength of the first laser is tuned to excite an Sm atom from the 4f^66s^2 ^7FJ（J = 1,2） states to many odd-parity states with different electronic configurations. The Sm atoms in the excited states are then detected sensitively with photoionization. Precise measurement on the 4f^66s6p and 4f^55d6s^2 states of the Sm atom is made using an ultraviolet laser with wavelength of 355 nm. The energy levels of 4f^66s6p and 4f^55d6s^2 states are identified exactly with the information of relative intensity. With a detailed analysis on the spectral data through the theoretical method, we not only confirm some energy levels of the Sm atom in literature, but also report many new spectral data.

关 键 词：Sm原子光谱 奇宇称激发态 光电离探测 

分 类 号：O433[机械工程—光学工程]