光子计数成像研究  

Research on photon counting imaging technology

作　　者：寇松峰[1] 陈钱[1] 顾国华[1] 季尔优[1] 

机构地区：[1]南京理工大学电子工程与光电技术学院,江苏南京210094

出　　处：《应用光学》2008年第5期675-678,共4页Journal of Applied Optics

基　　金：装备预先研究项目(4040508011)

摘　　要：从APD阵列的响应特性出发,利用随机点的统计学描述,建立了光子计数成像的一维点过程数学模型。通过对光子事件发生时间统计特性的描述,分析了光子密度、门控时间、雪崩光电二极管恢复时间等因素对光子计数成像质量的影响。并采用蒙特卡罗方法,对近红外波段不同光子密度条件下多种计数间隔的成像质量进行了仿真,给出了仿真结果。Based on the response characteristics of the avalanche photodiode array （APD）, a 1-D point process model of the photon counting imaging was established by using the statistics description of the random points. The effects of the photon density, APD＇s quench time, gate time and sample periods on the quality of the photon counting imaging were analyzed with the random sample theory of Poisson point process. The qualities of photon counting imaging was simulated at different photon density in the near-infrared band with Monte Carlo simulation method. The simulation results are presented.

关 键 词：光子计数成像 雪崩光电二极管阵列 泊松点过程 蒙特卡罗仿真 

分 类 号：TN151[电子电信—物理电子学]