碳纤维结构的常用表征技术  

Common Characterization Methods of Carbon-Fiber Structures

作　　者：侯锋辉[1] 邓红兵[1] 李崇俊[1] 李瑞珍[1] 

机构地区：[1]西安航天复合材料研究所,西安710025

出　　处：《纤维复合材料》2008年第3期18-20,31,共4页Fiber Composites

摘　　要：本文结合近几年的研究报道,归纳了决定碳纤维性能及应用的两个方面内部体结构和表面结构的一些常用表征技术。碳纤维聚集态的表征主要通过X-射线衍射(广角、小角)、电子衍射;碳纤维形态结构特征常用透射电子显微镜;碳纤维表面结构的表征方法有扫描电子显微镜(SEM),原子力显微镜(AFM),扫描隧道显微镜(STM)以及扫描力显微镜(SFM)。其中,SEM能够看到整个纤维的表面形貌,而AFM、STM、SFM用于表面几个纳米到几百个纳米范围的形貌分析。此外,表面化学状态(表面成分、表面官能团)表征主要依靠X光电子能谱。On the basis of latest development in carbon fiber, some characterization methods on microstructure and surface property which determine the property and application of carbon fiber is summarized. Aggregation morphology of carbon fiber is mostly studied by X- ray diffraction （wide angle,small angle）, electron diffraction, and transmission electron microscopy （TEM） is commonly employed to determine micro- morphology of carbon fiber. Characterization methods on surface morphology involve scanning electron microscopy （SEM）,atomic force microscopy （AFM）,scanning tunneling microscope （STM） and scanning force microscope （SFM）, and surface morphology of entire fiber is obtained by SEM, but two or three to several hundred nanometer surface morphology is obtained by AFM, STM, SFM. In addition, the fiber surface composition and surface functional groups were mostly examined hv X- ray photoelectron spectroscopy （XPS）.

关 键 词：碳纤维 表征 X射线衍射 透射电子显微镜 X光电子能谱 小角X线散射 

分 类 号：TQ342.742[化学工程—化纤工业] TB383[一般工业技术—材料科学与工程]