化探样品中二十五个主要、次要和微量元素的 X 射线荧光光谱测定  

DETERMINATION OF GEOCHEMICAL MATERIALS BY X-RAY FLUORESCENCE SPECTROMETRY

作　　者：袁汉章[1] 刘洋[1] 贾乐庚 

机构地区：[1]北京有色金属研究总院

出　　处：《分析化学》1989年第7期652-655,共4页Chinese Journal of Analytical Chemistry

摘　　要：本文选择了最佳测量条件,找出了一个寻找背景的简便方法,着重研究了关于在铁吸收限长波边微量元素的基体校正问题。Determination of 25 elements in the geochemical samples have been performed. Major and trace elements are determined directly with ground powder samples. A Rigaku 3070E model XRF spectrometer with seven fixed monochromators is used. Determination of all elements are performed using a Rh target X-ray tube. As many as 36 geochemical reference samples are used as calibration standards. Background position of each peak can be found unisg artificial mixture containing 30 elements. The valleys on scanning chart are selected as position of background. In order to reduce the analytical duration, the same background position is used for several peaks. Major element determinations show accuracy in the range 0.1—3％ and precision in 0.1—1.5％. Accuracy for trace elements is generally in the range 2-46 ppm and precision generally in 0.5-10％ with the exception of La (13％).

关 键 词：化探样品 荥光光谱法 X射线 元素 

分 类 号：P632.1[天文地球—地质矿产勘探]