一种新的光热干涉探测技术  

A Novel Intcrferomctric Detection Scheme for Photothcrmal Measurements

作　　者：李斌成[1] 程介克[1] 邓延倬[2] 

机构地区：[1]武汉大学化学系,武汉430072 [2]武汉大学分析测试中心,武汉430072

出　　处：《中国激光》1997年第12期1085-1089,共5页Chinese Journal of Lasers

基　　金：国家自然科学基金资助项目

摘　　要：提出了一种以样品前后表面反射的探测光束在远场形成干涉为基础的新的光热干涉探测技术.给出了聚焦激光束照射平板样品时两反射光束在远场形成的干涉场光强分布和调制光束加热时的光热干涉信号表达式.光强分布和实验测量结果一致.并以氟铝酸盐玻璃平板为样品进行了光热实验.还讨论了该光热方法作为一种灵敏的检测技术在光学材料特性、弱吸收测量以及微体积痕量分析等方面的应用前景.In this paper, a novel sensitive photothermal interferometric detection technique, which is based on the interference of the two reflected probe beams from the front and rear surfaces of a plate sample, is developed. Both theoretical intensity profile of the interference fringe pattern and experimental measurement are presented. The signal expression for modulated photothermal interferometric detection scheme is given and the photothermal measurement is carried out with the fluoroaluminate glass plate as the sample. The potential applications of this sensitive photothermal interferometric detection scheme to material characterization, weak absorption measurement, as well as microvolume trace analysis are discussed.

关 键 词：微体积痕量分析 光热干涉探测 光检测技术 

分 类 号：TN247[电子电信—物理电子学] TH744.3[机械工程—光学工程]