云纹干涉法测量铁电陶瓷的离面位移  

Application of Moire Interferometry for Measuring the Out of plane Displacement in Ferroelectric Ceramics

作　　者：白辰阳[1,2] 桂治轮[1,2] 李龙土 傅承诵[1,2] 

机构地区：[1]清华大学材料与工程系 [2]清华大学工程力学系

出　　处：《压电与声光》1997年第6期427-430,共4页Piezoelectrics & Acoustooptics

基　　金：新型陶瓷与精细工艺国家重点实验室开放基金

摘　　要：文章采用反射式高灵敏度离面云纹干涉法测量了铁电陶瓷的离面位移。在铁电陶瓷上复制了每毫米１２００位相型闪耀光栅的试件栅；采用迈克尔逊干涉光路、全息干版照相、ＣＣＤ摄像机及其微机实时图像处理系统获取了试件表面的离面位移场的干涉条纹图。The reflective high sensitivity moire interferometry was applied to measure out of plane displacement fields in ferroelectric ceramics. A phase type blazed specimen grating of 1200 lines/mm was replicated on the surface of the ferroelectric ceramics; the Michelson interferometer arrangement, the holographic plate, moire fringe real time processing system with CCD and personal computer was adopted to collect and process the moire fringe, and to calculate out of plane displacement fields.

关 键 词：铁电陶瓷 电致伸缩 离面位移 云纹干涉法 

分 类 号：TM280.13[一般工业技术—材料科学与工程]