利用迹线测量晶体材料中特征面取向的EBSD方法  

EBSD method for identifying the crystalline orientation of special planes by measurement of traces on surface

作　　者：谢季佳[1] 徐娟[2] 洪友士[1] 

机构地区：[1]中国科学院力学研究所非线性力学国家重点实验室,北京100190 [2]河北工业大学材料学院,天津300130

出　　处：《电子显微学报》2008年第4期271-274,共4页Journal of Chinese Electron Microscopy Society

基　　金：国家自然科学基金资助项目(No.10772178)~~

摘　　要：本工作研究了从单一投影面测量块体晶体材料内部特征面的EBSD方法。首先对样品表面进行SEM观察并采集图像,利用图像分析软件测量各迹线在样品台坐标系的取向。然后进行EBSD扫描获得迹线两侧各晶粒对应的取向,进一步利用坐标变换关系计算出晶粒内部的特征面迹线在晶格坐标中的方向指数。最后将全部测量的迹线的极点标示到反极图中,并与各低指数晶面的大圆位置进行对比,重合度最高的晶面就是特征面最可能的晶体学取向面。This paper investigated the EBSD method for identifying the crystalline orientation of inner special planes in bulk sample from only one projection of the sample. Firstly, the sample surface with traces of special planes was observed. The orientations of the traces in the stage coordinates were acquired by using image measurement. Then, the EBSD analysis was carried out on sample surface to identify the orientations of grains with traces. According the coordinates transformation between the stage coordinates and crystalline coordinates, the orientations of traces in crystalline coordinates were calculated. Finally, all the pole points of traces in crystalline coordinates were drawn in the inverse-pole figure and compared with the big circles of special crystalline planes with low index. If the big circles of one plane coincide with all the pole points, that plane must be the most possible orientation of the special planes.

关 键 词：迹线 晶体取向 电子背散射衍射 反极图 

分 类 号：O76[理学—晶体学] TG115.23[金属学及工艺—物理冶金]