检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
机构地区:[1]清华大学物理系
出 处:《光谱学与光谱分析》2008年第9期1987-1989,共3页Spectroscopy and Spectral Analysis
基 金:教育部科学研究重大项目(306020)资助
摘 要:掺锡氧化铟(ITO)薄膜同时具备在近红外波段的低反射和红外波段的高反射特性,其介电常数可由Drude自由电子模型描述。SiO薄膜在特定的红外波长处有很强的吸收。将二者结合,可实现特定的光谱选择性。本文对SiO/ITO膜系的光谱选择性进行了研究,讨论了膜系结构对反射光谱的影响。通过用特征矩阵计算反射光谱,发现适当调整膜系的组合方式及选择膜层参量,用SiO/ITO膜系可以做成兼容型红外低目标特征涂层。Indium tin oxide (ITO) film has low reflectance in near infrared band while high reflectance in infrared band, and its dielectric constant can be described by Drude free-electron model. SiO film has very strong absorption at certain infrared wavelength. By combining them, certain spectral selectivity can be realized. In the present paper, the authors investigated SiO/ITO films in terms of spectrum selectivity, and discussed the influence of film structure on reflection spectrum. By means of the computation of reflection spectrum with characteristic matrix, the authors found that SiO/ITO film can be used as a compatible infrared low target feature coating by properly adjusting film arrangement and selecting suitable film parameters.
分 类 号:TB34[一般工业技术—材料科学与工程]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.28