Measurement Techniques for Low-Intensity Beam on HI-13 Tandem Accelerator  

Measurement Techniques for Low-Intensity Beam on HI-13 Tandem Accelerator

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作  者:GUO Gang, CHEN Quan, HUI Ning, TENG Rui, JIANG Zhao, SHEN Dong-jun, LIU Jian-chen, CAI Li, WU Bin 

出  处:《Annual Report of China Institute of Atomic Energy》2007年第1期103-104,共2页中国原子能科学研究院年报(英文版)

摘  要:Single event effect (SEE), induced when an energetic charged particle in natural space environment passes through the sensitive region of space-borne microelectronic device, can cause theSingle event effect (SEE), induced when an energetic charged particle in natural space environment passes through the sensitive region of space-borne microelectronic device, can cause the on-orbit spacecraft running abnormal, more severely result in catastrophe. The problems associated with these effects become more severe as the feature size of microelectronic devices decreases. It is necessary that the ground simulation experiment based on the suitable accelerator be carried out to measure the curve of the SEE cross section versus linear energy transfer (LET) for heavy ion or energy for proton. Only the devices which ability of the SEE hardening meets application. the requirement can be used in the specific space

关 键 词:串列式加速器 线性能量转移 低能量射束 测量技术 

分 类 号:TL52[核科学技术—核技术及应用]

 

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