模拟电路的振荡测试技术  

Oscillation-Based Test Technique for Analog Circuits

作　　者：胡庚[1] 王红[1] 杨士元[1] 

机构地区：[1]清华大学自动化系,北京100084

出　　处：《半导体技术》2008年第10期845-849,共5页Semiconductor Technology

基　　金：国家973计划项目(2005CB321604);国家自然科学基金资助项目(60773142);教育部博士点基金资助项目(20070003122)

摘　　要：集成电路设计和制造技术的发展给电路测试带来了巨大的挑战,其中模拟电路的测试是电路测试的难点。目前在这一领域有许多致力于降低测试难度,节约测试成本的研究。介绍了一种称为"振荡测试"的模拟电路测试技术,从振荡电路的构造、测试响应的测量和分析等方面综述了振荡测试技术的研究现状,同时总结了振荡测试技术的优点,分析了当前存在的局限性,并对将来的发展进行了展望。The development in IC design and fabrication brings great challenges to circuit test. Test of analog circuits is especially a difficulty. Nowadays a lot of researches are done in this domain, dedicating for decreasing test difficulty and reducing test cost. A test technique for analog circuits called ＂oscillation-based test＂ is introduced, the present status is summarized including the construction of oscillator, the measurement and interpretation of test response and so on. Meanwhile the advantages and limitations of this technique are concluded, and the prospect of future development is also presented.

关 键 词：集成电路测试 模拟电路 振荡测试 

分 类 号：TN45[电子电信—微电子学与固体电子学]