用干涉环法分析CSTN-LCD盒厚均匀性  

Analyse of CSTN-LCD Gap Cell Uneven Using Interference Loop Methods

作　　者：马怀香[1] 

机构地区：[1]深圳天马微电子股份有限公司,深圳518118

出　　处：《现代显示》2008年第10期41-44,共4页Advanced Display

摘　　要：总结了CSTN空盒及实盒对应干涉环的一些情况,用劈尖原理推算了空盒干涉环明、暗环对应盒厚差值等,推算值与实测值基本相符;提出用实盒干涉环规整程度分析CSTN-LCD盒厚均匀性或颜色均匀性,由此可以相应深入分析产生盒厚不匀的相关原因。The interference loop of CSTN filled cell and unfilled cell were summarized. The unfilled cell gap are calculated using wedge theory. That result was coincident with the testing result. The authors suggested using the form of interference loop to analyze cell uniformity. If the interference loop was regular, then that CSTN cell was even. Moreover, the authors analyzed the cause of the cell uneven using this method.

关 键 词：CSTN—LCD 空盒 实盒 干涉环 盒厚均匀性 

分 类 号：TN141[电子电信—物理电子学]