用ICP-MS测定高纯氧化镝中痕量稀土元素  

Determination of Trace Rare Earth Elements in High Purity Dy 2O 3 by Inductively Coupled Plasma Mass Spectrometry

作　　者：刘湘生[1] 蔡绍勤[1] 柳凤粉[1] 鲁毅强[1] 张楠[1] 

机构地区：[1]北京有色金属研究总院

出　　处：《分析测试学报》1997年第5期37-40,共4页Journal of Instrumental Analysis

基　　金：国家"八五"重点科技攻关课题

摘　　要：考察了源于基体镝的多原子离子干扰。研究了基体对待测稀土杂质信号的影响，采用Ｔｌ内标能基本上补偿基体影响。建立了直接测定高纯氧化镝中痕量稀土杂质的电感耦合等离子体－质谱法。检测限为００１３～００８８μｇ／Ｌ，平均回收率为９２３％～１０１４％，相对标准偏差为２７％～９２％。方法简便、快速、灵敏。The interferences originated from multiatomic ions of Dy 2O 3 matrix and the matrix effect on signals of rare earth impurities were studied The matrix effect has been basically eliminated by adding internal standard element Tl Thus a method for direct determination of rare earth impurities in highly pure dysprosium oxide was developed by using ICP MS This method is simple,rapid and sensitive with a detection limits(3σ, n =10)of 0 013～0 088 μg/L, recoveries of 92 3%～101 4%,and RSD of 2 7%～9 2%

关 键 词：氧化镝 稀土杂质 内标法 铊 ICP MS 

分 类 号：O614.33[理学—无机化学]