一种存储器板的测试生成技术研究与实现  

Research on Test-generation Technology for a Memorizer Circuit Board

作　　者：张波 宁小玲[2] 程江涛[3] 

机构地区：[1]海军电子装备电路板测试维修中心,山东青岛266100 [2]海军航空工程学院,山东烟台264001 [3]海军航空工程学院青岛分院,山东青岛266041

出　　处：《计算机测量与控制》2008年第10期1402-1404,共3页Computer Measurement &Control

摘　　要：为了达到较高的故障覆盖率,研究了一种可把存储器板故障定位到器件级的测试生成方法;该方法首先从功能上对电路从控制总线、数据总线、地址总线以及RAM组进行分块,再结合路径敏化法使测试接近实际工作状况激活故障点的方式编写测试激励,最后通过数字仿真软件——LASAR仿真软件生成可加载到众多测试系统上的符合国际标准数字测试交换格式DTIF(IEEE 1445)的标准测试数据;仿真结果表明,该方法操作简单、有效,故障覆盖率达到了90%,是一种很可行的存储器板测试生成方法。In order to get the higer fault coverage, this paper studies a test generation technology for memory circuits board which can locate the component faults. Firstly, several circuit function blocks are divided into control bus, data bus. address bus and RAMs based on function; Secondly, combining with sensitization path method to make test be close to the reality compiles test vectors; Finally, using digital simulation software --LASAR generates standard test data which accords with DTIF （IEEE 1445） which can be used in numerous ATEs. The result indicates that the technology manipulates easily and is effective, the fault coverage reaches 90%, it is a feasible test generation technology.

关 键 词：存储器板 路径敏化 测试生成方法 LASAR 

分 类 号：TP306[自动化与计算机技术—计算机系统结构]