Numerical Simulation for the 16 August 1999 EUV Brightenings  

作　　者：SHA Xiaoming FAN Quanlin 

机构地区：[1]State Key Laboratory of Space Weather, Center for Space Science and Applied Research, Chinese Academy of Sciences, Beijing 100190 [2]Graduate University of Chinese Academy of Sciences

出　　处：《空间科学学报》2008年第6期507-512,共6页Chinese Journal of Space Science

基　　金：Supported by the National Natural Science Foundation of China(40374056,40536029,40574068);the International Collaboration Research Team Program of Chinese Academy of Sciences

摘　　要：The 16 August 1999 EUV brightenings are numerically simulated by a third-order upwind compact scheme,basing on the TRACE observation.The present simulation can give a possible explanation to its formation and evolution.The numerical results show that the initial reconnection jets at around X-point are responsible for the occurrence of EUV brightening.The strong and superposed ejections caused by the first and second coalescence of magnetic islands are possibly related to the lifted material which initially appeared as absorption features and Later EUV-emitting structures respectively.The bi-directional reconnection jets may correspond to the lifted material that either continued to move upward along the apparently open field lines or fell down to the surface.The 16 August 1999 EUV brightenings are numerically simulated by a third-order upwind compact scheme, basing on the TRACE observation. The present simulation can give a possible explanation to its formation and evolution. The numerical results show that the initial reconnection jets at around X-point are responsible for the occurrence of EUV brightening. The strong and superposed ejections caused by.the first and second coalescence of magnetic islands are possibly related to the lifted material which initially appeared as absorption features and Later EUV-emitting structures respectively. The bi-directional reconnection jets may correspond to the lifted material that either continued to move upward along the apparently open field lines or fell down to the surface.

关 键 词：数字模拟技术 轨迹 吸收能力 空间科学 

分 类 号：TU312.1[建筑科学—结构工程] X53[环境科学与工程—环境工程]