ANALYSIS OF CIRCUIT TOLERANCE BASED ON RANDOM SET THEORY  

作　　者：Xu Xiaobin Wen Chenglin 

机构地区：[1]Department of Electrical and Automation, Shanghai Maritime University, Shanghai 200135, China [2]School of Automation, Hangzhou Dianzi University, Hangzhou 310018, China

出　　处：《Journal of Electronics(China)》2008年第6期852-859,共8页电子科学学刊（英文版）

基　　金：the National Natural Science Foundation of China (No.60772006, 60434020);the Zhejiang Natural Science Foundation (No.R106745, Y1080422).

摘　　要：Monte Carlo Analysis has been an accepted method for circuit tolerance analysis, but the heavy computational complexity has always prevented its applications. Based on random set theory, this paper presents a simple and flexible tolerance analysis method to estimate circuit yield. It is the alternative to Monte Carlo analysis, but reduces the number of calculations dramatically.Monte Carlo Analysis has been an accepted method for circuit tolerance analysis, but the heavy computational complexity has always prevented its applications. Based on random set theory, this paper presents a simple and flexible tolerance analysis method to estimate circuit yield. It is the alternative to Monte Carlo analysis, but reduces the number of calculations dramatically.

关 键 词：Random set theory Evidence theory Tolerance analysis Monte Carlo analysis Circuit yield 

分 类 号：TP202[自动化与计算机技术—检测技术与自动化装置]