一种利用等离子体X射线激光输出对称性测量X射线多层膜镜反射率的方法  

A Novel Way of Measuring the Multilayer Reflectivity Utilizing the Symmetrical Output of XRL in Plasma

作　　者：程涛[1,2] 黄文忠[3] 孟立民[1,2] 李英骏[1] 赵静[2] 张杰[2] 

机构地区：[1]中国矿业大学,北京100083 [2]中科院物理研究所光物理实验室,北京100080 [3]中国工程物理研究院激光聚变中心,四川绵阳621900

出　　处：《光子学报》2008年第11期2288-2291,共4页Acta Photonica Sinica

基　　金：国家自然科学基金(10474137);国家973(2007CB815105);教育部博士点基金(20070290008)资助项目

摘　　要：从理论上论证了利用平板靶X射线激光两个输出端光强对称的特性来测量X射线多层膜镜反射率的测量方法.针对实验布局中等离子体对X射线激光吸收可能造成测量误差的情况,以保证测量结果千分之一的精确度为基准,从理论上计算获得该方法对不同波长X射线激光的实验布局要求.并依此要求对制得的Mo/Si、Mo/Mg镜的反射率进行了实验测量.A novel way of measuring the reflectivity of multilayer was proposed. Utilizing the symmetrical output of the X-ray laser in slab laser-plasma, the reflectivity could be conveniently obtained in this way. It was also given the setup parameters by calculation according to the demand of precise considering the absorption of X-ray laser by plasma. Under which an experiment of measuring the reflectivity of Mo/Si and Mo/Mg was carried out.

关 键 词：等离子体 X射线激光 多层膜反射镜 反射率测量 吸收 

分 类 号：O53[理学—等离子体物理]