新型单元的频率选择表面  

Novel element frequency selective surface

作　　者：贾宏燕[1,2] 高劲松[1] 冯晓国[1] 

机构地区：[1]中国科学院长春光学精密机械与物理研究所,吉林长春130033 [2]中国科学院研究生院,北京100049

出　　处：《光学精密工程》2008年第11期2076-2080,共5页Optics and Precision Engineering

基　　金：中国科学院国防创新基金资助项目(No.CXJJ-149)

摘　　要：通过对传统的十字单元进行改进，设计了一种新型单元的频率选择表面（FSS）。利用模式匹配法。从理论上对比分析了传统十字单元FSS和这种新型单元FSS，研究了TE波入射时角度变化和大角度人射时极化方式变化对中心频率的影响，并采用镀膜和光刻技术制备了新型单元FSS的实验样件。在微波暗室中进行了测试，得到的实验曲线与理论仿真曲线基本一致。结果表明，传统十字单元FSS不能实现中心频率的角度稳定性，TE波0°～45°的中心频率漂移为300MHz，并且45°人射时中心频率的极化稳定性很差，漂移量为800MHz；而新型单元FSS具有中心频率的角度稳定性，TE波0°～45°的入射中心频率漂移量仅为100MHz，同时对大的入射角度具有中心频率的极化稳定性。In order to improve the transmission property of Frequency Selective Surface （FSS） struc ture, a novel element FSS containing an improved cross element was presented. By applying modal matching approach, the novel element FSS was compared with the traditional cross element FSS theo- retically. The influence of the changing angles of TE incidence and the polarizations of large angle incident waves on center frequency was researched. With coating technology and lithography, FSS samples with improved elements were made. The tests were carried out in a microwave darkroom. The measured curve shows a good agreement with the emulated curve. The results show that the traditional cross element FSS can not have angle independence on TE incident waves or polarization independ- ence on large angle incidence, the drift of resonant frequency is 300 MHz for 0-45°TE incidence, and 800 MHz for different polarizations of 45° incident wave; In modified structure, the resonant frequen cy of FSS remains independent of incident angles, the drift of resonant frequency is only 100 MHz for 0-45° incident wave, also, the resonant frequency maintains the independence for different polarizations.

关 键 词：频率选择表面 极化稳定性 谐振频率 角度稳定性 

分 类 号：TN713[电子电信—电路与系统]