X-射线荧光光谱法测定硅石中主次成分  

Determination of major and minor components in silica by X-ray fluorescence spectrometry

作　　者：蒋晓光[1] 林忠[1] 李卫刚[1] 

机构地区：[1]鲅鱼圈出入境检验检疫局,辽宁营口115007

出　　处：《冶金分析》2008年第10期31-35,共5页Metallurgical Analysis

摘　　要：采用硅石标准样品及其复配标准样品作为校准样品,建立了熔融制样X-射线荧光光谱法测定硅石中SiO2,Fe2O3,Al2O3,CaO,MgO,K2O,TiO2,MnO,P2O5主次成分的方法。采用熔融法为试料片和校准片的制备方法,通过试验选择四硼酸锂-偏硼酸锂混合熔剂(12∶22,m/m)为助熔剂、1.00 mL LiBr溶液为脱模剂、稀释比为1∶20、熔融时间30 min。采用可变理论α系数对基体效应进行校正。对同一硅石样品进行测定的相对标准偏差(RSD)小于8%,对不同硅石样品进行测定,本法的测定结果与标准方法的测定结果相吻合,偏差在允许范围内,t检验合格。A method was introduced for the determination of major and minor components including SiO2,Fe2O3,Al2O3,CaO,MgO,K2O,TiO2,MnO,P2O5 in silica by X-ray fluorescence spectrometry with silica standard sample and synthetic standard sample as calibration sample. The preparation of testing sample and calibration sample were carried out by fusion method. Other experimental conditions were conformed as follow. Li2B4O7-LiBO2 （12：22 ,m/m） as fusing agent, 1.00mL of LiBr as remover,the dilution ratio was 1：20 and the fusion time was 30min. Matrix effect was calibrated by using a coefficient of variable theory. Comparative tests for the same sample showed that the relative standard deviation（RSD） was less than 8% （n= 10）, while the determination results of different samples were consistent with those by standard method. Deviation can meet the demand of the permissible error in test values and t-test passed.

关 键 词：硅石 X-射线荧光光谱法 主次成分 熔融制样 

分 类 号：P575.4[天文地球—矿物学]