特征荧光X射线吸收法精确测定基于铍膜的^(235)U裂变靶厚度  

Mass Thickness Measurement of ^(235)U Fission Target on Beryllium Substrate by Using Characteristic Fluorescent X-ray Absorption Spectroscopy

作　　者：欧阳晓平[1] 刘林月[1] 黑东炜[1] 王宝慧[1] 

机构地区：[1]西北核技术研究所,陕西西安710024

出　　处：《原子能科学技术》2008年第11期997-1000,共4页Atomic Energy Science and Technology

摘　　要：研究发展了一种基于特征荧光X射线吸收谱的、可精确测量裂变物质质量厚度的方法,系统分析了测量不确定度。实验结果表明,该方法可有效测定基于铍膜的235U裂变靶质量厚度,测量不确定度小于5%,其不确定度主要来源于测量的统计性。By using the characteristic fluorescent X-ray absorption spectroscopy, a new strategy method was developed to measure the mass thickness of 235U fission target based on beryllium substrate accurately, and the metrical error was also analyzed. It was found that the mass thickness can be effectively obtained through this strategy method. The metrical error of mass thickness is less than 5%. Both the stability of X-ray resource and statistical fluctuation from X-ray measuring process by detection system can affect the accuracy of experiment result, and it is proved that the statistical fluctuation is a main contribution.

关 键 词：特征荧光X射线吸收谱 ^235U 裂变材料 质量厚度测量 铍基底 

分 类 号：O571.43[理学—粒子物理与原子核物理] O434[理学—物理]