不规则样品中元素含量XRF测定的校正  

Correction of XRF to content of element in irregular sample

作　　者：张帮[1] 葛良全[1] 程峰[1] 戴振麟[1] 贾牧霖[1] 

机构地区：[1]成都理工大学核技术与自动化工程学院,成都610059

出　　处：《核电子学与探测技术》2008年第5期961-964,914,共5页Nuclear Electronics & Detection Technology

基　　金：中国地质调查局项目(编号:1212010706501)资助

摘　　要：介绍了当样品的被测底面积不能视为无限大时目标元素含量的测量方法。从理论上说明了特散比R是与样品的被测量底面积无关的参数,通过实验证明特散比法是解决不规则样品中元素含量测量问题的很有效方法。A measurement of the content of determined element when the bottom area of sample can not be regarded as infinite is described. The ratio of characteristic to scatter is a parameter that is nothing with the bottom area of sample from theoretic. Experimentation proves that the method of characteristic/scattering ratio is a effective method to solve the measurement of content in irregular sample.

关 键 词：X射线荧光分析 特散比 不规则样品 

分 类 号：P575.5[天文地球—矿物学] O434.12[天文地球—地质学]