基于随机测试的SoC系统级功能验证方法的研究  

Research on methodology of SoC system level function verification based on random testing

作　　者：杨珺[1] 曹阳[1,2] 马秦生[1] 张宁[1] 冯浩[1] 

机构地区：[1]武汉大学电子信息学院,湖北武汉430079 [2]武汉大学软件工程国家重点实验室,湖北武汉430072

出　　处：《电子技术应用》2008年第12期149-152,共4页Application of Electronic Technique

基　　金：国家863重大专项(2002AA1Z1490);国家集成电路设计深圳产业化基地研究生创新基金项目;华为技术有限公司高校合作研究基金项目

摘　　要：为了克服 RTL 级验证方法的局限性,提出了采用随机测试向量在 SoC 的系统级进行功能验证的方法。该方法采用高级建模语言来构建系统级的测试平台,采用多种随机化机制来生成测试向量。测试结果表明,该方法不仅能够获得较好的功能覆盖率,而且能够尽可能早地发现 SoC 设计中的功能性错误。In order to deal with the limitation during the register transfer level verification, a new function verification methodology of SoC system level which is based on random testing is proposed and established in this article. Specifically, testbeneh for system level verification according to the new methodology is designed using modeling language. Moreover, test cases for the system level testbench is generated according to the mechanism of randomization. The result of test sequences testified that functions for the system level can be validated completely and more functional errors can be found in the earlier SoC design cycles compared with register transfer level.

关 键 词：SOC 系统级功能验证 随机测试 

分 类 号：TN406[电子电信—微电子学与固体电子学] TN790.7