红外检测中的点阵加热方法  

The Study of Dot Matrix Heating Stimulation in the Infrared Non-damage Test

作　　者：杨永春[1] 石继程[1] 赵金赛[1] 

机构地区：[1]中国海洋大学工程学院,青岛266100

出　　处：《无损检测》2008年第12期906-907,913,共3页Nondestructive Testing

基　　金：国家高技术研究发展(863)计划项目(2006AA09Z331)

摘　　要：红外热像检测中的热激励方式直接影响检测结果。提出了点阵加热热激励方法。采用有限元软件ANSYS,对存在表面裂纹和内部气孔缺陷的试件分别进行点阵加热下的热传导计算,分析温度分布规律。将计算结果与同样缺陷下热波检测的结果进行对比。试验表明,点阵加热不仅能用于检测构件的内部缺陷,同时也能用于发现其表面裂纹缺陷。In the process of infrared nondestructive testing, the method of heating stimulation directly determines the factuality of the results. A new method of heating stimulation, dot matrix heating based on current existing heating approaches was proposed. By using the universal FEM analysis software ANSYS, the test process with the metal component which has facial crevice or inner airy defects was simulated, and the temperature distribution features was analyzed. By comparing the results with results of thermal wave test, it showed that dot matrix heating cannot only be used to detect inner defects, but also facial crevice.

关 键 词：红外热像检测 点阵加热 缺陷 有限元分析 

分 类 号：TG115.28[金属学及工艺—物理冶金]